宇航计测技术 ›› 2015, Vol. 35 ›› Issue (2): 22-26.doi: 10.12060/j.issn.1000-7202.2015.02.06

• 论文 • 上一篇    下一篇

测量引线热电势对热电阻测温系统测温结果的影响分析

黄赜1；崔文德1；赵化业1   

  1. 1、北京航天计量测试技术研究所，北京 100076
  • 出版日期:2015-04-15 发布日期:2015-04-15
  • 作者简介:黄赜（1989-），男，硕士研究生，主要研究方向：测试计量技术及仪器。

Analysis of Effect by Thermoelectric Potential in RTD Temperature Measurement System

HUANG Ze1；CUI Wen-de1；AHAO Hua-ye1   

  1. 1、Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing 100076
  • Online:2015-04-15 Published:2015-04-15

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摘要： 热电阻测温系统广泛采用单向电流恒定激励，通过测量热电阻两端电势差获得热电阻阻值的方法进行温度测量。而此类测温系统受到测量引线热电势的影响，所测得热电阻的阻值往往与实际阻值存在一定的偏差，从而影响测温结果。对电路中热电势对热电阻测温结果产生影响的机理进行了分析，并通过实验验证了分析结果，提出了减小或消除热电势差对测温结果影响的建议。

关键词: 温度, 热电势, 测量

Abstract: The fixed constant excitation current direction is widely used in RTD temperature measurement system. Usually the temperature is measured by measuring the resistance of RTD which is gauged from potential difference. The system is always affected by the thermoelectric potential. The measured resistance of RTD is different from the actual data, which will affect the temperature measurement results. The mechanism of thermoelectric potential which impacts on the results of the temperature measurement in the circuit is analyzed and the analytical results are verified by experiment. The recommendation and guidance of reducing or eliminating the impact of the thermoelectric potential difference on the results of temperature measurement are proposed.

Key words: Temperature, Thermoelectric potential, Measurement

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