宇航计测技术 ›› 2024, Vol. 44 ›› Issue (4): 17-22.doi: 10.12060/j.issn.1000-7202.2024.04.03

• 量值传递技术 • 上一篇    下一篇

压力传感器温度响应特性校准装置研究

高炳涛,孙海涛,霍瑞东,郭一梦,王小三,黄其刚   

  1. 北京航天计量测试技术研究所,北京 100076
  • 出版日期:2024-08-25 发布日期:2024-09-14
  • 作者简介:高炳涛(1988-),男,高级工程师,硕士,主要研究方向:力学计量技术。

Research on Pressure Sensors Temperature-response Characteristics Calibration Device

GAO Bingtao,SUN Haitao,HUO Ruidong,GUO Yimeng,WANG Xiaosan,HUANG Qigang   

  1. Beijing Aerospace Institute for Metrology and Measurement Technology,Beijing 100076,China
  • Online:2024-08-25 Published:2024-09-14

摘要: 为确保测量数据的准确性,需对压力传感器在高低温环境下温度响应特性参数进行校准,通过开展标准压力源、温度隔离单元、多点测温校准腔等系统设计,研制了一套压力传感器温度响应特性校准装置,实现了在-50 ℃至100 ℃环境温度条件下,对绝压2~500 kPa范围内压力传感器校准,校准装置测量不确定度优于0.05%(k=2),为开展压力传感器温度响应特性研究奠定了基础。

关键词: 校准, 压力传感器, 校准装置

Abstract: In order to ensure the accuracy of the measurement data,it is necessary to calibrate the temperature-response characteristics parameters of the pressure sensor under high and low temperature environment.The temperature-response characteristics calibration device for the pressure sensors is developed by designing systems such as the standard pressure sources,the temperature isolation units,and the multi-point temperature measurement calibration chambers.The calibration of the pressure sensors,within the pressure range of absolute pressure 2~500 kPa and under the ambient temperature conditions of -50 ℃~100 ℃,is realized.The measurement uncertainty of the calibration device is better than 0.05% (k=2),laying the foundation for conducting research on the temperature response characteristics of pressure sensors.

Key words: Calibration, Pressure sensor, Calibration device

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