Abstract: With the rapid development of electronic products, improving the quality of the product, while decreasing product prices is also attended by consumers. Array of electronic products for a low price, the core chip production costs need to be reduced firstly.In passive UHF RFID (Radio Frequency Identification) area, test cost is large percent of the total cost. Therefore a novel centralized CP test method is proposed. Compared with the current test method, which is testing parallel 8 chips every time, the test time of one group centralized CP test method can be optimized for more than 68%. If changing the number of chips existing in the single test group or adopting multi-groups centralized CP test, the test cost can be cut down substantially, and the market competitiveness of the chip products can be enhanced.

Key words: Integrated circuit, Low cost, Core, Measurement