宇航计测技术 ›› 2013, Vol. 33 ›› Issue (2): 67-70.doi: 10.12060/j.issn.1000-7202.2013.02.15

• 论文 • 上一篇    下一篇

稳频半导体激光器线宽测量

韩顺利1   

  1. 1、电子测试技术重点实验室，中国电子科技集团公司第四十一研究所，青岛 266555
  • 出版日期:2013-04-15 发布日期:2013-04-15
  • 作者简介:韩顺利（1982-），男，博士，工程师，主要研究方向：红外及光电测量技术。
  • 基金资助:
    重点实验室基金项目（9140C120301110C1203）

Linewidth Measurement of the Frequency-stabilized Semiconductor Laser

HAN Shun-li1   

  1. 1、Science and Technology on Electronic Test & Measurement Laboratory,The 41st Institute of CETC, Qingdao 266555
  • Online:2013-04-15 Published:2013-04-15

PDF (PC)

摘要： 窄线宽稳频激光器在精密干涉测量、光学频率标准、激光通信、激光陀螺、激光雷达、基本物理常数测量、冷原子系统等研究领域有着广泛的应用。稳频激光器的线宽是评价稳频性能的一个重要参数，利用AV4036系列频谱分析仪设计并搭建了用于稳频半导体激光器拍频线宽测量的实验系统，验证了方案的可行性。

关键词: 半导体激光器, 频率稳定性, 线宽测量

Abstract: Semiconductor laser with narrow linewidth and high frequency stability is widely used in precision interference measurements, optical frequency standards, laser communication, laser gyroscope, laser radar, measurements of fundamental physics constants, cold atomic system and so on. The linewidth of the locking laser is an important parameter to evaluate the performance of frequency stabilization. The linewidth measurement scheme of frequency-stabilized semiconductor laser is designed by using AV4036 series spectrum analyzer. The feasibility of the linewidth measurement system is demonstrated by the results.

Key words: Semiconductor laser, Frequency stability, Linewidth measurement

京ICP备09048426号-4　 京公网安备 11010602060144号　版权所有 © 《宇航计测技术》编辑部