Journal of Astronautic Metrology and Measurement ›› 2018, Vol. 38 ›› Issue (5): 24-32.doi: 10.12060/j.issn.1000-7202.2018.05.04

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Summary of the Development Trend of Foreign Metrology and#br# Measurement

DU Xiao-shuang1;HU Yi-fei1;FENG Ying-qiang1;LI Xin-liang2;LIU Min3;LIU Yuan-dong4;ZHAO Huan1   

  1. 1、Beijing institute of radio metrology & measurement, Beijing 100039, China; 2、Changcheng institute of metrology &
    measurement, Beijing 100095, China; 3、Beijing Oriental Institute of Measurement & Test, Beijing 100086, China; 4、The
    first-rank chemistry metrology institute of national defense science and technology industry, Jinan 250031, China
  • Online:2018-10-25 Published:2018-10-25

Abstract: Metrology is the science of measurement and its applications. Specifically, metrology implementation is an activity for unified measuring units and accurate, reliable quantity value, its technical level directly reflects the status of the scientific and technical development.By collecting and sorting lots of documents on the transform of units system, quantization technology, micronano dimension technology, space metrology technology, carbon nano materials technology, intelligent metrology technology. A summary of the development trend of foreign advanced metrology and measurement technology is given and a close analysis is made in this paper, providing a useful reference for the development of China’ national defense metrology and measurement.

Key words: Metrology, International system of units, Quantum effect, Micronano, Space metrology, Carbon nano materials, Intelligent metrology technology, Femtosecond laser Terahertz