宇航计测技术 ›› 2012, Vol. 32 ›› Issue (5): 41-44.doi: 10.12060/j.issn.1000-7202.2012.05.09

• 论文 • 上一篇    下一篇

串联电容法校准高值电容的不确定度分析

吴康1；李亚琭1；刘民1   

  1. 1、北京东方计量测试研究所，北京 100086
  • 出版日期:2012-10-15 发布日期:2012-10-15

Uncertainty Analysis of High Capacitance Calibration by Series Capacitor Method

WU Kang1；LI Ya-lu1；LIU Min1   

  1. 1、Beijing Orient Institute of Measurement and Test, Beijing 100086
  • Online:2012-10-15 Published:2012-10-15

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摘要： 分析与计算了利用高准确度自动电桥AH2700A及标准电容Agilent 16380C（1??F）为标准，采用串联电容法校准10μF~1mF高值电容的测量结果不确定度。经过不确定度分析，10μF电容的测量不确定达到0.02%，100μF电容的测量不确定达到0.1%，1mF电容的测量不确定达到0.6%。

关键词: 串联电容法, 高值标准电容, 不确定度分析

Abstract: The article analysis and calculate uncertainty of 10μF~1mF high capacitance’s measurement results by series capacitor method which standard are high accuracy bridge AH2700A and standard capacitor Agilent 16380C（1??F）.Via uncertainty analysis, measurement uncertainty of capacitor of 10??F is 0.02%,measurement uncertainty of capacitor of 100??F is 0.1%, the measurement uncertainty of capacitor of 1mF is 0.6%.

Key words: Series capacitor method, High capacitance standard, Uncertainty analysis

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