Journal of Astronautic Metrology and Measurement ›› 2025, Vol. 45 ›› Issue (2): 49-62.doi: 10.12060/j.issn.1000-7202.2025.02.03
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FENG Jianan1,HU Jianyang1,ZHANG Xiujian2,LIN Jie1,*,JIN Peng1,*
1.Key Laboratory of Micro-systems and Micro-structures Manufacturing,Ministry of Education,Harbin Institute of Technology,Harbin 150001,China;
2.Key Laboratory of Artificial Intelligence Measurement and Standards,Beijing Aerospace Institute for Metrology and Measurement Technology,Beijing 100076,China