Journal of Astronautic Metrology and Measurement ›› 2025, Vol. 45 ›› Issue (2): 63-71.doi: 10.12060/j.issn.1000-7202.2025.02.04
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ZHENG Xu1,2,LIU Jing2,ZHANG Lizong1,2,*,YAN Ke1,2,SONG Faren3,CHANG Qingxue4
1.University of Electronic Science and Technology of China,Chengdu 611731,China;
2.Kash Institute of Electronics and Information Industry,Kashi 844099,China;
3.University of Electronic Science and Technology of China,Shenzhen Institute for Advanced Study,Shenzhen 518000,China;
4.Sichuan Huakun Zhenyu Intelligent Technology Co.,Ltd,Chengdu 610000,China