Abstract: In response to the demand for accurate measurement of surface emissivity of infrared materials,the directional spectral emissivity and hemispherical total emissivity of the sample materials were measured using a spectral equipment with integrating sphere attachment and a emissometer at room temperature in the laboratory,and the results were converted.Through the study of the two measurement methods,it is shown that the spectral emissivity of infrared materials is consistent with the hemispherical total emissivity,which verifies the effectiveness of the two measurement methods and provides a reference for the measurement of surface emissivity parameters of infrared materials.

Key words: Spectral emissivity, Hemispherical emissivity, Integrating sphere reflectometer, Emissometer