JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT ›› 2013, Vol. 33 ›› Issue (2): 67-70.doi: 10.12060/j.issn.1000-7202.2013.02.15

Previous Articles     Next Articles

Linewidth Measurement of the Frequency-stabilized Semiconductor Laser

HAN Shun-li1   

  1. 1、Science and Technology on Electronic Test & Measurement Laboratory,The 41st Institute of CETC, Qingdao 266555
  • Online:2013-04-15 Published:2013-04-15

Abstract: Semiconductor laser with narrow linewidth and high frequency stability is widely used in precision interference measurements, optical frequency standards, laser communication, laser gyroscope, laser radar, measurements of fundamental physics constants, cold atomic system and so on. The linewidth of the locking laser is an important parameter to evaluate the performance of frequency stabilization. The linewidth measurement scheme of frequency-stabilized semiconductor laser is designed by using AV4036 series spectrum analyzer. The feasibility of the linewidth measurement system is demonstrated by the results.

Key words: Semiconductor laser, Frequency stability, Linewidth measurement