A Novel Location Technology Based on SIFT Features Matching
CHEN Xiao-jun1;WANG Dan-dan1;HU Tao2;ZHAO Wen1
1、The institute of Aerospace system engineering Beijing,Beijing 100076;
2、Harbin Institute of Technology, Department of Automatic Measurement and Control,Harbin 150001
CHEN Xiao-jun;WANG Dan-dan;HU Tao;ZHAO Wen. A Novel Location Technology Based on SIFT Features Matching[J]. JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT, 2012, 32(4): 60-64.