DUT Matching Characteristic Measurement Under High Power Pulse Condition

doi:10.12060/j.issn.1000-7202.2012.03.02

JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT ›› 2012, Vol. 32 ›› Issue (3): 5-7.doi: 10.12060/j.issn.1000-7202.2012.03.02

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DUT Matching Characteristic Measurement Under High Power Pulse Condition

SUN Xin-li¹；CHEN Gang¹；BAI Hao¹

1、China Electronics Technology Group Corporation 20th Research Institute, Xi’an 710068

Online:2012-06-15 Published:2012-06-15

Abstract

SUN Xin-li；CHEN Gang；BAI Hao. DUT Matching Characteristic Measurement Under High Power Pulse Condition[J]. JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT, 2012, 32(3): 5-7.

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DUT Matching Characteristic Measurement Under High Power Pulse Condition

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