JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT ›› 2012, Vol. 32 ›› Issue (1): 65-68.doi: 10.12060/j.issn.1000-7202.2012.01.15

Previous Articles     Next Articles

Research on Test Technology for Virtex-E Series FPGAs

LIU Qian1;WU Dan1;ZHANG Ting1;SHEN Sen-zu1   

  1. 1、Wuhan Digital Engineering Institute, Wuhan 430074
  • Online:2012-02-15 Published:2012-02-15

Abstract: FPGA is a very important device which is being widely used in IC design and many other areas. With the rapid development of FPGAs, test technology for FPGAs is becoming more and more complicated. This paper takes XILINX Virtex XCV300E for example, studies the test technology for FPGA based on 93000 test system.

Key words: FPGA test, Testability design, Configuration, Test pattern