Study on the Calibration Technology of On-wafer S-parameter Measurement System
WU Ai-hua;SUN Jing;LIU Chen;LIANG Fa-guo;ZHENG Yan-qiu
JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT . 2015, (5): 11 -16 .  DOI: 10.12060/j.issn.1000-7202.2015.05.03