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中文
A Brief Analysis of Three-proof Design Technology for Instrument and Meter Cabinet
FENG Jing-jing;WEI De-lin;WU Chun-yan
JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT . 2017, (
2
): 86 -90 . DOI: 10.12060/j.issn.1000-7202.2017.02.18