Investigation on the Measurement of Complex Permittivity of Substrate of Microwave Printed Circuit Board
BU Ling-hui;XIANG Bo;DOU Wen-bin
JOURNAL OF ASTRONAUTIC METROLOGY AND MEASUREMENT . 2013, (5): 12 -18 .  DOI: 10.12060/j.issn.1000-7202.2013.05.03