Journal of Astronautic Metrology and Measurement ›› 2025, Vol. 45 ›› Issue (1): 103-108.doi: 10.12060/j.issn.1000-7202.2025.01.17

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The Technology of Widely Tunable Semiconductor Lasers for Small Angle Measurement

CHANG Pengyuan1,ZHONG Haoran1,HUANG Xinrong1,MIAO Jie2,GE Zheyi2,PAN Duo2,*,CHEN Jingbiao2,3   

  1. 1.Institute of quantum information and technology,Nanjing University of Posts and Telecommunications,Nanjing 210003;

    2.Institute of Quantum Electronics,School of Electronics,Peking University,Beijing 100871;

    3.Hefei National Laboratory,Hefei 230088
  • Online:2025-03-15 Published:2025-03-27

Abstract: Angle measurement,a core task in physics,has advanced from geometric methods to highly precise technologies.It plays a critical role in scientific research,precision manufacturing,and satellite positioning.However,traditional angle measurement methods,including non-interference methods,interference methods,electromagnetic,and inertial method,face inherent limitations in resolution.To address this limitation,an angle-to-frequency conversion measurement technique has been proposed.Leveraging the high sensitivity of narrow-band interference filter external cavity diode lasers (ECDLs) to angular changes of the interference filter,the filter is fixed to the measured object,converting small angular variations into changes in the laser frequency.By using a stable reference frequency source and employing beat frequency comparison,the frequency shifts of the output laser are precisely detected,enabling ultra-high-precision angular measurements of the device.Compared with traditional angle measurement methods,this approach transforms angular measurement into frequency measurement,significantly enhancing the capability for precision measurements of small angles,aiming to achieve an angular resolution on the order of 0.000 1 arcseconds.

Key words: Interference filter, External cavity diode laser, Angle measurement, Time-frequency measurement, Angle resolution

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