Journal of Astronautic Metrology and Measurement ›› 2024, Vol. 44 ›› Issue (6): 28-41.doi: 10.12060/j.issn.1000-7202.2024.06.04

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Progress and Prospect of Artificial Intelligence Application in Metrology

GONG Kenan,HU Bo,XU Xuan,HUANG Yifan,CHENG Fang   

  1. National Institute of Metrology,Beijing 100029,China
  • Online:2024-12-15 Published:2025-01-21

Abstract: Artificial Intelligence (AI) technologies are increasingly applied in metrology,bringing new vitality to traditional measurement methods.The applications and development trends of AI in metrology is systematically reviewed from micro,meso and macro levels.At the micro level,the innovative applications of AI in optical measurement,mechanical measurement,quantum metrology,and automated calibration,is analyzed.At the meso level,the integration of intelligent sensor networks,edge AI,and blockchain technologies are discussed.At the macro level,the practical applications of AI in environmental monitoring and industrial manufacturing is summarized.Based on literature analysis,it is found that AI metrology research has shown rapid growth over the past decade,with a significant increase in research intensity after 2018.Focusing on key issues such as standardization,uncertainty quantification,and model interpretability,current challenges and prospects for future research directions are explored.

Key words: Artificial intelligence, Intelligent sensor networks, Quantum metrology, Uncertainty quantification, Standardization, Interdisciplinary integration

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