Journal of Astronautic Metrology and Measurement ›› 2024, Vol. 44 ›› Issue (5): 39-44.doi: 10.12060/j.issn.1000-7202.2024.05.06
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LI Ang1,2,ZHOU Tiezhong1,XUE Xiaobo1,2,YI Hang1,2,CHEN Dehao1,2
1.Beijing Institute of Metrology and Measurement,Beijing 100039,China;
2.National Key Laboratory for Metrology and Calibration Techniques, Beijing 100039, China