宇航计测技术

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大型双反射紧缩场幅相特性校准技术研究

马永光1;杨金涛1;吴翔1;何鑫1;黄承祖1;黄建领1   

  1. 1、北京无线电计量测试研究所,北京 100039
  • 出版日期:2019-10-25 发布日期:2019-10-25
  • 作者简介:马永光(1978.05-),男,高级工程师,博士,主要研究方向:紧缩场、微波暗室、屏蔽室等电磁环境测量,天线、天线罩特性测量技术。

Research on Calibration Technology for Amplitude and Phase #br# Characteristics of Large Double Reflector Compact Field

MA Yong-guang1;YANG Jin-tao1;WU Xiang1;HE Xin1;HUANG Cheng-zu1;HUANG Jian-ling1   

  1. 1、Beijing Institute of Radio Metrology and Measurement,Beijing 100039,China
  • Online:2019-10-25 Published:2019-10-25

摘要: 紧缩场是天线、目标RCS测试的关键设备,它能在近距离内把馈源发出的球面波校准为准平面波。为评定紧缩场静区产生的电磁波分布是否符合准平面波特性,需要现场搭建高性能微波幅相收发系统和大型多自由度高精度扫描系统。本文以大型双反射面紧缩场静区性能校准需求为例,从现场计量幅相系统构建、大型复杂扫描系统设计、现场计量实施等方面详细分析了紧缩场静区性能现场校准相关技术。实测结果表明现场搭建的校准系统满足远距离大型双反射面紧缩场静区性能计量需求,各项检测参数量值均满足该紧缩场设计指标要求。

关键词: +紧缩场, +幅度, 相位, 校准技术

Abstract: The compact field is the key device for antenna and target RCS testing.It can calibrate the spherical wave from the feed to a quasi-planar wave at close range.In order to evaluate whether the electromagnetic wave distribution generated in the quite zone of the compact field conforms to the quasi-planar wave characteristics,it is necessary to build a high-performance microwave amplitude-phase transmitting and receiving system and a large-scale multi-degree-of-freedom high-precision scanning system on site.In this paper,the performance calibration requirements of a large double reflector compact field are taken as an example.From the aspects of on-site measurement of amplitude and phase system construction,large-scale complex scanning system design,and on-site measurement implementation,the related technologies of field calibration of compact field quite zone performance are analyzed in detail.The measured results show that the calibration system built on site meets the performance requirements of the long-distance large double-reflection surfacecompact field quiet zone,and the values of each test parameter meet the design requirements of the compact field.

Key words: +Compact field, +Amplitude, Phase, Calibration technology